For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera