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NIR Lens UN-GNIR3520L-20MP

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.


· High relative illumination and high contrast

· Low distortion and excellent corner brightness

· High resolution

· Compatible with 1" and 1.1" 20MP camera

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