NIR Lens UN-GNIR3520L-20MP

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.

· High relative illumination and high contrast

· High resolution

· Compatible with 1" and 1.1" 20MP camera

For SMT Assembly Inspection, Food/Beverage/Pharmaceutical Packaging Inspection , Printing & Label Inspection, etc.

· Developed for 2/3" image format
· Compact and lightweight design
· Low distortion
· High relative illumination

· Focus and iris fixed with screw

Product information: Custom designs are available upon request.

A Neutral Density filter allows a photographer to control the exposure in an image very easily. The filter stops light reaching the camera sensor, therefore allowing us to leave the camera with a higher aperture for a longer amount of time.

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.

· Developed for 1" image format

· Large Aperture, up to F1.4

· Compact and lightweight design

For photovoltaic cell EL hidden crack detection, semiconductor wafer & chip packaging micro-inspection, FPC circuit testing, lithium battery ultra-thin copper foil micro-defect screening, Mini/Micro LED panel defect detection, narrow metal strip precision surface testing and high-precision dimensional measurement of tiny electronic components.

· Developed for 40mm big frame sensor