For photovoltaic cell EL hidden crack detection, semiconductor wafer & chip packaging micro-inspection, FPC circuit testing, lithium battery ultra-thin copper foil micro-defect screening, Mini/Micro LED panel defect detection, narrow metal strip precision surface testing and high-precision dimensional measurement of tiny electronic components.
· Developed for 40mm big frame sensor
· Large Aperture· High relative illumination· Lens for 2K, 4K, 6K line scan camera· Excellent optical performance, uniform imaging of center and edge