For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.
· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design
For SMT Assembly Inspection, Food/Beverage/Pharmaceutical Packaging Inspection , Printing & Label Inspection, etc.
· Developed for 2/3" image format
· Compact and lightweight design
· Low distortion
· High relative illumination
· Focus and iris fixed with screw
Product information: Custom designs are available upon request.
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