For Smart Sensors & Photovoltaic Inspection
· Developed for φ28 image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design
For photovoltaic cell EL hidden crack detection, semiconductor wafer & chip packaging micro-inspection, FPC circuit testing, lithium battery ultra-thin copper foil micro-defect screening, Mini/Micro LED panel defect detection, narrow metal strip precision surface testing and high-precision dimensional measurement of tiny electronic components.
· Developed for 40mm big frame sensor
· Large ApertureCopyright © UNI OPTICS CO., LTD © All Rights Reserved.