FA Lens UN-TFA1220X-12MP

For high-precision machine vision applications, widely covering dimensional inspection and surface defect detection for consumer electronics, food and pharmaceutical packaging detection, printing & label inspection, robotic vision guidance and precise positioning, as well as in-line dimensional measurement of automotive components in typical industrial scenarios.

· High relative illumination and high contrast
· Low distortion and excellent corner brightness

· High resolution

· Compatible with 4/3" 12MP camera

Product information: Custom designs are available upon request.

For high-precision machine vision applications, widely covering dimensional inspection and surface defect detection for consumer electronics, food and pharmaceutical packaging detection, printing & label inspection, robotic vision guidance and precise positioning, as well as in-line dimensional measurement of automotive components in typical industrial scenarios.

· High relative illumination and high contrast
· Low distortion and excellent corner brightness

· High resolution

· Compatible with 4/3" 12MP camera

Product information: Custom designs are available upon request.

For high-precision machine vision applications, widely covering dimensional inspection and surface defect detection for consumer electronics, food and pharmaceutical packaging detection, printing & label inspection, robotic vision guidance and precise positioning, as well as in-line dimensional measurement of automotive components in typical industrial scenarios.

· High relative illumination and high contrast
· Low distortion and excellent corner brightness

· High resolution

· Compatible with 4/3" 12MP camera

Product information: Custom designs are available upon request.

For high-precision machine vision applications, widely covering dimensional inspection and surface defect detection for consumer electronics, food and pharmaceutical packaging detection, printing & label inspection, robotic vision guidance and precise positioning, as well as in-line dimensional measurement of automotive components in typical industrial scenarios.

· High relative illumination and high contrast
· Low distortion and excellent corner brightness

· High resolution

· Compatible with 4/3" 12MP camera

Product information: Custom designs are available upon request.

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For high-end PCB AOI micro-inspection, Mini/Micro LED panel pixel defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow high-temperature metal strip flaw detection, luxury anti-counterfeit printing texture inspection, electronic ceramic substrate microscopic testing, UAV high-precision aerial survey mapping and ultra-precise online dimensional measurement of micro electronic components.

· Developed for 82mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For lithium battery electrode, copper foil and ceramic separator inspection, PCB & single-layer FPC AOI detection, silicon wafer routine sorting, food packaging & label printing quality control and electronic ceramic substrate inspection.

· Covering a wide working distance range

· Lockable distance and aperture settings

Product information: Custom designs are available upon request.

For high-end PCB AOI inspection, Mini/Micro LED panel micro-defect detection, photovoltaic silicon wafer EL hidden crack inspection, narrow precision metal strip flaw detection, luxury printing anti-counterfeit texture inspection, electronic ceramic substrate microscopic inspection and high-precision linear dimension measurement of tiny electronic components.

· Developed for 66mm big frame sensor
· Low distortion
· Compatible for 16K line scan camera
· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.

For medium-wide lithium foil & separator full roll inspection, large-format backlight film & light guide plate testing, wide-size standard PCB & FPC AOI detection, large silicon wafer routine sorting, long-distance railway rail flaw inspection, medium-width cold-rolled metal strip surface testing, wide-format printing & flexible packaging quality control, large electronic ceramic substrate inspection.

· Covering a wide working distance range

· Lockable distance and aperture settings

Product information: Custom designs are available upon request.