For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.
· Developed for 1" image format
· Wavelength: 900-1700m· Large Aperture, up to F1.4
· Compact and lightweight design
For Vision-Guided Positioning Systems, Semiconductor Defect Inspection, Agricultural Remote Sensing Imaging, Hyperspectral Camera, etc.
· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design
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