SWIR Lens UN-GSWIR1214C

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.

· Developed for 1" image format

· Large Aperture, up to F1.4

· Compact and lightweight design

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For Automated Optical Inspection (AOI), Food Sorting, Recycling Sorting, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, upto F1.4
· Compact and lightweight design

For Photovoltaic Inspection, Pill / Capsule Detection, Print Inspection, Hyperspectral Camera, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For narrow-format lithium battery electrode, copper foil and ceramic separator inspection, PCB & single-layer FPC AOI detection, silicon wafer routine sorting, food packaging & label printing quality control, miniature electronic ceramic substrate inspection and vehicle undercarriage scanning.

· Covering a wide working distance range

· Lockable distance and aperture settings

Product information: Custom designs are available upon request.

For hygiene product inspection, textile and non-woven fabric surface testing, flexible packaging & large-format printing quality checking, plastic film and paper web flaw detection, flat glass and building panel surface screening, metal strip preliminary defect inspection, lumber board sorting and agricultural material sorting.

· Developed for 30mm big frame sensor

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.