SWIR Lens UN-GSWIR2514C

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.

· Developed for 1" image format

· Large Aperture, up to F1.4

· Compact and lightweight design

For Vision-Guided Positioning Systems, Semiconductor Defect Inspection, Agricultural Remote Sensing Imaging, Hyperspectral Camera, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For Automated Optical Inspection (AOI), Food Sorting, Recycling Sorting, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, upto F1.4
· Compact and lightweight design

For High-Precision Machine Vision Applications: Consumer Electronics Dimensional Inspection, Surface Defect Detection, OCR & Code Reading, Robotic Guidance, Biomedical Imaging and so on.

· Developed for 1/1.8" image format
· Low distortion
· High relative illumination

· Focus and iris fixed with screw

Product information: Custom designs are available upon request.

For color sorting equipments, textile and non-woven fabric surface testing, flexible packaging & large-format printing quality checking, plastic film and paper web flaw detection, flat glass and building panel surface screening, metal strip preliminary defect inspection, lumber board sorting and agricultural material sorting.

· Developed for 30mm big frame sensor

· Excellent optical performance, uniform imaging of center and edge

Product information: Custom designs are available upon request.