SWIR Lens UN-GSWIR2514C

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.

· Developed for 1" image format

· Large Aperture, up to F1.4

· Compact and lightweight design

For Vision-Guided Positioning Systems, Semiconductor Defect Inspection, Agricultural Remote Sensing Imaging, Hyperspectral Camera, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For Automated Optical Inspection (AOI), Food Sorting, Recycling Sorting, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, upto F1.4
· Compact and lightweight design

For Intelligent Transportation Systems (ITS) Applications: Road Surveillance, ANPR/ALPR, Automatic Incident Detection, Traffic Enforcement Systems, Railway/Tunnel Safety Monitoring, etc.

· Excellent edge sharpness and uniform illumination
· Designed to resist strong light interference, adaptable to complex lighting conditions
· Ultra-high resolution, accurately capture license plates and facial details

Product information: Custom designs are available upon request.