SWIR Lens UN-GSWIR3514C

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.

· Developed for 1" image format

· Large Aperture, up to F1.4

· Compact and lightweight design

For Vision-Guided Positioning Systems, Semiconductor Defect Inspection, Agricultural Remote Sensing Imaging, Hyperspectral Camera, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.

· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

For Automated Optical Inspection (AOI), Food Sorting, Recycling Sorting, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, upto F1.4
· Compact and lightweight design

For Photovoltaic Inspection, Pill / Capsule Detection, Print Inspection, Hyperspectral Camera, etc.

· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

For high-precision machine vision applications, widely covering dimensional inspection and surface defect detection for consumer electronics, food and pharmaceutical packaging detection, printing & label inspection, robotic vision guidance and precise positioning, as well as in-line dimensional measurement of automotive components in typical industrial scenarios.

· High relative illumination and high contrast
· Low distortion and excellent corner brightness

· High resolution

· Compatible with 4/3" 12MP camera

Product information: Custom designs are available upon request.