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SWIR Lens UN-GSWIR3514C

For Security Recognition & Hyperspectral Camera, Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

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Related Products
SWIR Lens UN-GSWIR0618C
SWIR Lens UN-GSWIR0618C

For Security Surveillance, Vehicle & Drone Obstacle Avoidance, Semiconductor Wafer Inspection, etc.


· Developed for 1" image format

· Wavelength: 900-1700m

· Large Aperture, up to F1.4

· Compact and lightweight design

SWIR Lens UN-GSWIR1214C
SWIR Lens UN-GSWIR1214C

For Vision-Guided Positioning Systems, Semiconductor Defect Inspection, Agricultural Remote Sensing Imaging, Hyperspectral Camera, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

SWIR Lens UN-GSWIR10020C
SWIR Lens UN-GSWIR10020C

For Semiconductor Wafer Inspection, Wildfire Detection & Ember Monitoring, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

SWIR Lens UN-GSWIR752S-14MP
SWIR Lens UN-GSWIR752S-14MP

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.


· Developed for 1.1" image format
· Wavelength: 800-1700nm
· Large Aperture, up to F2.0
· Compact and lightweight design

SWIR Lens UN-GSWIR0814CL
SWIR Lens UN-GSWIR0814CL

For Hyperspectral Camera, Fruit & Vegetable Sorting Equipment, Perovskite Solar Cell Defect Detection


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design



SWIR Lens UN-GSWIR1614C
SWIR Lens UN-GSWIR1614C

For Automated Optical Inspection (AOI), Food Sorting, Recycling Sorting, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, upto F1.4
· Compact and lightweight design

SWIR Lens UN-GSWIR2514C
SWIR Lens UN-GSWIR2514C

For Photovoltaic Inspection, Pill / Capsule Detection, Print Inspection, Hyperspectral Camera, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

SWIR Lens UN-GSWIR5014C
SWIR Lens UN-GSWIR5014C

For Semiconductor Wafer Inspection, Biomedical Imaging, Logistics Package Sorting, Wildfire Detection & Ember Monitoring, etc.


· Developed for 1" image format
· Wavelength: 900-1700nm
· Large Aperture, up to F1.4
· Compact and lightweight design

Fused Silica Wedges Prisms
N-BK7 and Fused Silica Wedge Prisms
Wedge prism is an optical element with plane-inclined surfaces, usually the faces are inclined toward one another at a very small angles.  It diverts light toward its thicker portion.  Wedge prisms can be used as isolating components. Wedges may also be used to produce a small deviation which doesnt allow return to source.
NIR Lens UN-GNIR1620L-20MP
NIR Lens UN-GNIR1620L-20MP

For semiconductor wafer internal defect inspection, solar cell & glass surface testing, plastic & waste material sorting, food and agricultural non-destructive grading, pharmaceutical packaging inspection, multi-spectral laboratory imaging, high-speed industrial surface inspection, electronic police license plate capture.


· High relative illumination and high contrast

· Low distortion and excellent corner brightness

· High resolution

· Compatible with 1" and 1.1" 20MP camera

FA Lens UN-TFA0824C-10MP
FA Lens UN-TFA0824C-10MP

For high-precision machine vision applications, broadly covering dimensional inspection and surface defect detection in consumer electronics, robotic vision guidance and positioning, as well as automotive component in-line measurement, and intelligent logistics & sorting systems and so on.


· High image contrast
· High brightness uniformity
· Suitable for 2.4u sensor

· Resolution up to 10MP

· Compact, lightweight and durable


Product information: Custom designs are available upon request.

Objective Lens UN-UW00102024C-5MP
Objective Lens UN-UW00102024C-5MP
For micro-component microscopic inspection, semiconductor wafer & chip packaging detection, PCB solder joint defect testing, medical endoscope imaging, tiny equipment internal observation, laser beam focusing, precision miniature dimension measurement and laboratory microscopic analysis.
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